Holographic Transmission Electron Microscope (HOLO-TEM) allows for subatomic resolution with reduced electron beam intensities, thereby minimizing radiation-induced damage to the sample. These features, along with the ability to perform holographic and tomographic analyses, make it an ideal tool for examining sensitive samples of biological and biomedical interest without damaging them.
The JEOL JEM-ARM200F NEOARM is a next generation transmission electron microscope fine-tuned for the atomic resolution study of organic and inorganic materials sensitive to radiation damage. The presence of a cold cathode field emitting electron gun (C-FEG), having high brilliance and spatial coherence, combined with a dual CETCOR/ASCOR spherical aberration corrector, allows to obtain images with very high resolution and quality within a
range of acceleration values between 30 kV and 200 kV.
The microscope is also equipped with an electron biprism with a platinum filament that permits to obtain images of organic macromolecules (single proteins, protein complexes, etc.) by using electron holography. The instrument also features a focused cryo ion beam scanning electron microscopy (
cryo-FIB/SEM+iFLM) station, which combines fluorescence and SEM imaging together with ion milling in a single instrument. Currently, this is the only microscope of its kind in Italy and one of the few in Europe with such innovative characteristics.
Moreover, the instrument is equipped with a series of JEOL detectors and different types of sample holders that enable (also in cryo mode):
- Morphological analysis in HR-TEM and STEM/HAADF modes: 72 pm resolution
- Structural Analysis: Selected area electron diffraction, SAED (1 μm), Electron diffraction (area <100 nm)
- Elemental compositional analysis: EDX (energy-dispersive X-ray spectroscopy), EELS (electron energy-loss spectroscopy), Compositional mapping for both EDX and EELS
- Electron holography of magnetic materials
- 3D tomography.
Characteristics:
- Accelerating voltage from 30 to 200 kV
- High brightness C-FEG with Flash &Go technology
- Dual CETCOR/ASCOR corrector, of spherical aberration up to the 5th order
- Resolution: 72pm
- EDS detector with SDD technology
- Gatan® Imaging Filter (GIF) type “Continuum ER,” with CMOS detector, 2048 x 2048 pixels
- Gatan® Rio16 digital CMOS camera, 16 MP (4,096 x 4,096)
- Gatan® K3 IS basic digital camera, 14.2 MP (3,456 x 4,092)
- Resolution: STEM HAADF image 70 pm (200 kV), 100 pm (80 kV), 160 pm (30 kV)
- TEM information limit 100 pm (200 kV), 110 pm (80 kV), 250 pm (30 kV)
- Electron gun: Cold field emission gun (Cold FEG): standard
- Aberration corrector: STEM: NEO ASCOR HOAC (higher order aberration corrector), TEM: CETCOR with DSS
- Corrector auto tuning system: NEO JEOL COSMO Auto tuning system Ad-hoc tune (SIAM) built-in
- Accelerating voltage: 30 to 200 kV (30, 80, 200 kV: standard, 60, 120 kV: optional)
- Magnetic field free mode: Lorentz lens settings (x50 to 80 k on screen): standard
- Specimen movement system: X, Y and Z super-fine mechanical drive, ultra-fine piezo device drives: standard
- Operation type: RDS operation (room divided style).
The microscope is available to users through
CERIC-ERIC and is part of the "BOL: Bio Open Lab" project funded by the Ministry of University and Research (Research and Innovation PON 2014-2020 program).
📍 The “HOLO-TEM” station is located at the “Ennio de Giorgi” Department of Mathematics and Physics of the University of Salento.
